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While Accuprobe has
more than one hundred standard probe card designs in stock that can be
adapted for a wide range of devices and probing systems, some
applications call for custom probe card designs to meet unique test
requirements. Accuprobe offers a fast, competitive design and
fabrication service for custom designs to be used on first test through
volume production. |
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Continuing technology developments combined with the
quest for competitive differentiation often leads to the need for unique
test environments to prove or verify fundamental design assumptions.
Device sizes, pad locations, functionality and associated test criteria
can lead to the need for a probe card solution that cannot be met with
an off-the-shelf probe card. Often the need is germinated in the
requirement to place active and passive components close to the device
under test. Other times unique device sizes and geometries, as well as
density and number of pin-outs drives the need for a custom platform for
device or wafer test. Accuprobe is quickly able to use it’s extensive
design resources and a wealth of existing probe card designs to create,
modify or adapt a probe card to meet unique customer needs. |
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