ACCUPROBE INC.

The PCAM series of Probe Card Assembly Machines provide a convenient and economical capability to assemble a wide range of fixed pattern probe cards. Accuprobe has applied a clean functional design approach that provides maximum utility and uncompromising precision. Both probe card assembly machines provide a wide range of motion for the precise manipulation of the probes allowing probe placement not only for perimeter contact pads but also on the more difficult devices with complex internal contact pad locations.

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The PCAM-100 is a general-purpose machine intended for all standard probe cards up to 6.5 inches in width including standard rectangular and round probe cards. For rectangular probe cards, the PCAM-100 will accommodate both standard (S, M, L, XL, XXL) and non-standard centers of rotation.

The PCAM-200 also has a probe exerciser that provides predetermined probe deflection to relieve any mechanical stresses that might affect probe position and planarization. In addition, the exerciser can be used in conjunction with Resistox™ to abrasively clean the probe tips. 

PROBE MANIPULATOR STAGE 

PCAM 100

PCAM 200

MANIPULATION ARM SWING 

45 Degrees

Same as 100

MANIPULATOR TRAVEL 

X=4.5 inches

X= 7.5 inches

Coarse & Fine Adjustments

Y=6.5 inches

Y= 8.0 inches

Coarse & Fine Adjustments

Z= .5 inches

Same as 100

Coarse & Fine Adjustments

PROBE ANGLE SWING 

30 Degrees

Same as 100

Fine Adjustments

PROBE FINE Z 

Z=.5 inches

Same as 100

Fine Adjustments

DEVICE MANIPULATOR STAGE 

PCAM 100

PCAM 200

VACUUM CHUCK SIZE 

3 INCHES

4 INCHES

CHUCK MOTION 

X=.5 inches
Y=.5 inches
Z=.5 inches
Theta=360°

Same as 100
Same as 100
Same as 100
Same as 100

VACUUM REQUIRED 

.5 CFM @ 10 inch Hg

Z-Grip-1                             B-Grip-1

A selection of one probe gripper is supplied with each machine. The Z-Grip-1 is intended for use with Z adjustable probes. The B-Grip-1 is intended for use with blade probes (either Metal or Ceramic blades) and is typically used with smaller blade profiles for wafer probing. Another blade gripper B-Grip-2 (not shown) is intended for use with larger blade probes that are typically used in Hybrid circuit applications. Please specify which probe gripper is desired when ordering the PCAM.

AC-4.5                            AC-6.5

Full motion to sweep over the complete surface of the Probe card.