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Z- Adjust. Probes
Spring Blade Probes
Metal Blade Probes
Probe Card Edge Sensors
Ceramic Blade Probes

 

 

ACCUPROBE INC.

ACCUPROBE Home

ACCUPROBE PROBE OVERVIEW 

Accuprobe provides a full range of probes used to test active and passive semiconductor and hybrid devices. Z-adjustable probes provide the ultimate in flexibility and maintainability. Metal blades probes are the workhorse of the industry and are available in a wide range of types and sizes. Ceramic blade probes have particular application in sensitive and high-frequency measurement applications. Pogo probes are useful where uneven substrates need to be accessed and tested. For additional information on these product types please click the links below.

Z ADJUSTABLE PROBES 

BLADE SPRING (POGO) PROBES 

Z Probes (Adjustable)

Z Probes (Adjustable)
are adjustable in the Z axis and are suitable for a wide variety of probing applications from Wafer sort to Hybrid Circuit Laser trim. 

Blade Spring Probes

BSP (Pogo) Probes 
Complete probe assemblies consisting of a blade body with receptacle and a spring probe inserted into the receptacle.

METAL BLADE PROBES 

PROBE CARD EDGE SENSOR 

Metal Blade Overview

Metal Blade Overview 
Accuprobe offers a wide selection of metal blade profiles for semiconductor, hybrid circuit and laser trim applications.

Special Z Probes and Accessories

Probe Card Edge Sensor   provides z axis position information to test applications. Standard and isolated versions are also available.

CERAMIC BLADE PROBES  

Ceramic Blade Overview

Ceramic Blade Overview
Accuprobe offers a wide selection of ceramic blade profiles for semiconductor, hybrid circuit and laser trim applications.

 

 

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Last modified: 2016-08-22