Accuprobe provides a full
range of probes used to test active and passive semiconductor and hybrid
devices. Z-adjustable probes provide the ultimate in flexibility and
maintainability. Metal blades probes are the workhorse of the industry and
are available in a wide range of types and sizes. Ceramic blade probes
have particular application in sensitive and high-frequency measurement
applications. Pogo probes are useful where uneven substrates need to be
accessed and tested. For additional information on these product types
please click the links below.
Z ADJUSTABLE PROBES
BLADE SPRING (POGO) PROBES
Z Probes (Adjustable)
are adjustable in the Z axis and are suitable for a wide variety of probing applications
from Wafer sort to Hybrid Circuit Laser trim.
(Pogo) Probes Complete probe
assemblies consisting of a blade body
with receptacle and a spring probe
inserted into the receptacle.
METAL BLADE PROBES
PROBE CARD EDGE SENSOR
Accuprobe offers a wide selection of metal blade profiles for semiconductor,
hybrid circuit and laser trim applications.
Card Edge Sensorprovides
z axis position information to test applications. Standard and isolated
versions are also available.
CERAMIC BLADE PROBES
Blade Overview Accuprobe offers a wide selection of ceramic blade
profiles for semiconductor,
hybrid circuit and
laser trim applications.