number of ancillary products for probcard testing, storing and analyzing.
A Precise mechanism for manual planarization of the
probe height (the Z-axis) from the probes on the probecard. It is an
excellent tool for hybrid and semiconductor probecards. It contains a
stable construction setup in combination with an accurate Z-stage. The
movement of the Z-stage can be repeatedly adjusted on the right working
depth and probe to probe level. In combination with the TECHNICIAN, the LEVELER is a
cost effective solution for testing the probecard status.
Software package for analyzing data that has been generated by the
probecard analyzer. A great tool for studying the weak points related to
the probecard. The
SPC techniques used in the ANALYST are:
CALIBRATION CARD FOR CALIBRATING THE PROBECARD ANALYZER
Measurement and calibrating tool for checking the
parallelism of the probecard holder related to the waferprober chuck or
probecard analyzers chuck. The EQUALIZER contains four holes, one in each
corner. Optional is a PC interface with software for a printed data report
which will also remind you to (re) calibrate the system when needed. A
MUST for your ISO environment. Available in a round, rectangular and
square shape with 1 or 4 digital depth meters.
Wooden box to store the probecard in a non-static
environment. This product has a much longer lifetime than the familiar
plastic storing boxes and is also non-static which reduces dust and